Good publication from the Ohio University & HP Labs (Mai Zheng,Joseph Tucek,Feng Qin,Mark Lillibridge)
Modern storage technology (SSDs, No-SQL databases, commoditized RAID hardware, etc.) bring new reliability challenges to the already complicated storage stack. Among other things, the behavior of these new components during power faults—which happen relatively frequently in data centers—is an important yet mostly ignored issue in this dependability-critical area. Understanding how new storage components behave under power fault is the first step towards designing new robust storage systems.
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